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1. RESEARCH TOPICS

  • Study of mechanical properties of materials by atomic force microscopy (AFM), micro- and nanohardness measurements and scratch test.
  • Study of the structure and mechanical properties of metal thin films deposited in vacuum or by electrolytic methods and annealed in vacuum.
  • Molecular dynamics simulations of physical properties of thin-film systems.
  • Analysis of the process of structure formation in atomic clusters by computer simulations.
  • Study of mechanical and structural properties of biological materials.
  • Physical properties and the structure of biopolymers.
  • Processes of nucleation and crystallization in solutions.


2. SCIENTIFIC EQUIPMENT

  • High-resolution Diffractometer Empyrean.
  • Ultra nanoindentation tester UNHT.
  • Nano scratch tester NST.
  • Atomic Force Microscope AFM.

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